Print: | ISSN 0256-1115 |
Online: | ISSN 1975-7220 |
Korean Journal of Chemical Engineering,
Vol.26, No.1, 285-287, 2009 Electrical characterizations of Neutron-irradiated SiC Schottky diodes
Abstract.Neutrons with an average energy of 9.8±0.8MeV were irradiated onto silicon carbide Schottky diodes. After bombardment at a fluency of 2.75×10^(11) neutron/cm^(2), the Schottky barrier height, ideality factor, and the leakage currents remained unchanged. The electrical properties began to deteriorate after bombardment at a fluency of 5.5×10^(11) neutron/cm^(2). In this study, we demonstrate that SiC SBD is robust under neutron irradiations and is well suited
for space operations up to bombardments at a fluency of 2.75×10^(11) neutron/cm^(2).
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