| Issue |
| Total 12 articles [ 키워드: Process Monitoring ] |
| No. | Article |
| 1 |
Korean Journal of Chemical Engineering, 39 (12), pp.3179-3189 (2022) Objectives, challenges, and prospects of batch processes: Arising from injection molding applications Zhou Y, Cao Z, Lu J, et al. |
| 2 |
Korean Journal of Chemical Engineering, 38 (12), pp.2406-2422 (2021) Data-driven fault detection for chemical processes using autoencoder with data augmentation Lee HD, Kim CS, Jeong DH, et al. |
| 3 |
Korean Journal of Chemical Engineering, 34 (8), pp.2135-2146 (2017) Sparse probabilistic principal component analysis model for plant-wide process monitoring Zeng J, Liu K, Huang W, et al. |
| 4 |
Korean Journal of Chemical Engineering, 34 (2), pp.275-286 (2017) Fault detection based on polygon area statistics of transformation matrix identified from combined moving window data Wang B, Yan X, Jin Y |
| 5 |
Korean Journal of Chemical Engineering, 31 (11), pp.1935-1942 (2014) Improved fault detection in nonlinear chemical processes using WKPCA-SVDD Jiang Q, Yan X |
| 6 |
Korean Journal of Chemical Engineering, 31 (11), pp.1943-1953 (2014) Hyperplane distance neighbor clustering based on local discriminant analysis for complex chemical processes monitoring Lu C, Xiao S, Gu X |
| 7 |
Korean Journal of Chemical Engineering, 31 (6), pp.930-943 (2014) Fault detection and identification using a Kullback-Leibler divergence based multi-block principal component analysis and bayesian inference Wang B, Jiang Q, Yan X |
| 8 |
Korean Journal of Chemical Engineering, 30 (6), pp.1181-1186 (2013) Fault detection in nonlinear chemical processes based on kernel entropy component analysis and angular structure Jiang Q, Yan X, Lv Z, et al. |
| 9 |
Korean Journal of Chemical Engineering, 26 (6), pp.1467-1475 (2009) Two-level multiblock statistical monitoring for plant-wide processes Ge Z, Song Z |
| 10 |
Korean Journal of Chemical Engineering, 21 (3), pp.575-581 (2004) Methods for Performance Monitoring and Diagnosis of Multivariable Model-based Control Systems Lee S, Yeom S, Lee KS |
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