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Low-Tempearature Preparation of Hydrothermal Lead Zirconate Titanate Thin Films

Kyung Won Seo^† Hyun Goo Kong

School of Chemical Engineering & Biotechnology, Ajou Univ., Suwon 442-749, Korea

kwseoi@madang.ajou.ac.kr

Korean Journal of Chemical Engineering, July 2000, 17(4), 455-460(6)
https://doi.org/10.1007/BF02706860

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Abstract

In preparing lead zirconate titanate thin films under hydrothemral conditions, we investigated the effects of concentrations of nutrient and mineralizer, reaction time and reaction temperature on crystallinity, grain size and shape. Experiments were performed in ranges of 0.1-1.0 M Pb(NO₃)₂, and 0-6.0 M KOH with varying reaction time from 0 to 48 hours at 60-200℃. In the experiment, lead zirconate titanate thin film of homogeneous crystalline grain was obtained through a 24 hours reaction with 0.4 M Pb(NO₃)₂ and 5.0 M KOH at 140℃. The thickness of the film was 0.9-1.6㎛, and it exhibited a saturation polarization (Ps) of 18.3μC/㎠, remnant polarization (Pr) of 7.4μC/㎠ and coercive field (Ec) of 0.41 kV/cm. The dielectric constant and loss (δ) measured at 1 kHz were approximately 1020 and 0.15, respectively.

Keywords

Lead Ziroconate Titanate Thin Films Hydrothermal Conditions Polarization Dielectric Constant

References

Amanuma K, Mori T, Hase T, Sakuma T, Ochi A, Miyasaka Y, Jpn. J. Appl. Phys., 32(1), 4150 (1993)
Aoki K, Fukuda Y, Nishmura A, Jpn. J. Appl. Phys., 32(1), 4147 (1993)
Jung ST, Seo KW, HWAHAK KONGHAK, 35(4), 520 (1997)
Kajiyoshi K, Ishizawa N, Yoshimura M, J. Am. Ceram. Soc., 74(2), 369 (1991)
Kim YM, Lee WJ, Kim HG, Thin Solid Films, 279(1-2), 140 (1996)
Park HH, Jin IS, Kim DH, Kim TS, Thin Solid Films, 332(1-2), 300 (1998)
Park SH, Kim DJ, Streiffer SK, Kingon AI, J. Mater. Res., 14(6), 2476 (1995)
Schwartz RW, Voigt JA, Tuttle BA, J. Mater. Res., 12(2), 144 (1997)
Seo KW, Kong HG, Korean J. Chem. Eng., submitted (1999)
Seo KW, Oh JK, Korean J. Chem. Eng., 17(1), 47 (2000)
Wang Z, Maeda R, Kikuchi K, Jpn. J. Appl. Phys., 38(1), 5342 (1999)
Yi G, Wu Z, Sayer M, J. Appl. Phys., 64(5), 2717 (1984)