Issue
Korean Journal of Chemical Engineering,
Vol.21, No.6, 1240-1244, 2004
Electrical Characterization of C-coated Nickel Silicide Nanowires Grown on Ni-loaded Si Substrate
Carbon-coated nickel silicide nanowires (C-coated NiSi NWs) were grown in a home-made chemical vapor deposition (CVD) reactor. The coating of semiconductor or metal nanowires with nano-sized carbon layer is effective to prevent the oxidation of the nanowires, resulting in the stabilization of electrical properties of nanodevices. The growth of the NiSi nanowires and the coating of the NWs with carbon layers simultaneously took place in the reaction. The current-voltage curve of individual NiSi nanowire showed highly linear behavior, indicating the good ohmic contact without the insulating layer. The resistivity of the NiSi nanowire was about 370 μΩ-cm at room temperature, decreased monotonically as the temperature was lowered, and became saturated at low temperatures, indicating the growth of metallic NiSi nanowires. Field emission measurements showed that the C-coated NiSi nanowires were an excellent field emitter with large emission current densities at very low electric field.
[References]
  1. Bockrath M, Cobden DH, Mceuen PL, Chopra NG, Zettl A, Thess A, Smalley RE, Science, 275(5308), 1922, 1997
  2. Carim AH, Lew KK, Redwing JM, Adv. Mater., 13, 1489, 2001
  3. Chen CC, Yeh CC, Chen CH, Yu MY, Liu HL, Wu JJ, Chen KH, Chen LC, Peng JY, Chen YF, J. Am. Chem. Soc., 123(12), 2791, 2001
  4. Chen CC, Yeh CC, Liang CH, Lee CC, Chen CH, Yu MY, Liu HL, Chen LC, Lin YS, Ma KJ, Chen KH, J. Phys. Chem. Solids, 62, 1577, 2001
  5. Chen YQ, Zhang K, Miao B, Wang B, Hou JG, Chem. Phys. Lett., 358, 396, 2002
  6. Derycke V, Martel R, Appenzeller J, Avouris P, Nano Lett., 1, 453, 2001
  7. Duan XF, Huang Y, Cui Y, Wang JF, Lieber CM, Nature, 409, 66, 2001
  8. Gudiksen MS, Lauhon LJ, Wang JF, Smith DC, Lieber CM, Nature, 415, 617, 2002
  9. hensel JC, Tung RT, Poate JM, Unterwald FC, Appl. Phys. Lett., 44, 913, 1984
  10. Kim TY, Lee SH, Mo YH, Shim HW, Nahm KS, Suh EK, Yang JW, Lim KY, Park GS, J. Cryst. Growth, 257, 97, 2003
  11. Lee ST, Wang N, Lee CS, Mater. Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process., 286, 16, 2000
  12. Martel R, Schmidt T, Shea HR, Hertel T, Avouris P, Appl. Phys. Lett., 73, 2447, 1998
  13. Nahm KS, Kim KC, Park CI, Lim KY, Yang YS, Seo YH, J. Chem. Eng. Jpn., 34(5), 692, 2001
  14. Osawa A, Okamoto M, Sci. Rep. Tohuku Univ. Ser., 127, 134, 1939
  15. Pradhan BK, Kyotani T, Tomita A, Chem. Commun., 14, 1317, 1999
  16. Rinzler AG, Hafner JH, Nikolaev P, Lou L, Kim SG, Tomanek D, Nordlander P, Colbert DT, Smalley RE, Science, 269(5230), 1550, 1995
  17. Shang NG, Meng FY, Au FCK, Li Q, Lee CS, Bello I, Lee ST, Adv. Mater., 14, 1308, 2002
  18. Wong KW, Zhou XT, Au FCK, Lai HL, Lee CS, Lee ST, Appl. Phys. Lett., 75, 2918, 1999
  19. Yi WK, Jeong TW, Yu SG, Heo JN, Lee CS, Lee JH, Kim WS, Yoo JB, Kim JM, Adv. Mater., 14, 1464, 2002
  20. Yi WK, Jeong TW, Yu SG, Heo JN, Lee CS, Lee JH, Kim WS, Yoo JB, Kim JM, Adv. Mater., 14, 1464, 2002
  21. Zhang XW, Wong SP, Cheung WY, Zhang F, Appl. Phys. Lett., 80, 249, 2002
  22. Zhang YF, Tang YH, Zhang Y, Lee CS, Bello I, Lee ST, Chem. Phys. Lett., 330, 48, 2000