| Issue |
| Total 9 articles [ 저자: Suh EK ] |
| No. | Article |
| 1 |
Korean Journal of Chemical Engineering, 23 (6), pp.1068-1068 (2006) Retraction: "Growth of GaN nanowires on Si substrate using Ni catalyst in vertical chemical vapor deposition reactor" [Korean J. Chem. Eng., 21(1), 257 (2004)] Kim TY, Lee SH, Mo YH, et al. |
| 2 |
Korean Journal of Chemical Engineering, 23 (6), pp.1068-1068 (2006) Retraction: "Growth mechanism of needle-shaped ZnO nanostructures over NiO-coated Si substrates" [Korean J. Chem. Eng., 21(1), 257 (2004)] Kim TY, Lee SH, Mo YH, et al. |
| 3 |
Korean Journal of Chemical Engineering, 23 (5), pp.860-865 (2006) Synthesis of ZnO nanowires on steel alloy substrate by thermal evaporation: Growth mechanism and structural and optical properties Umar A, Jeong JP, Suh EK, et al. |
| 4 |
Korean Journal of Chemical Engineering, 23 (3), pp.499-504 (2006) Synthesis of ZnO nanowires on Si substrate by thermal evaporation method without catalyst: Structural and optical properties Umar A, Ra HW, Jeong JP, et al. |
| 5 |
Korean Journal of Chemical Engineering, 22 (2), pp.298-302 (2005) Effects of Growth Variables on Structural and Optical Properties of InGaN/GaN Triangular-Shaped Quantum Wells Choi RJ, Suh EK, Lee HJ, et al. |
| 6 |
Korean Journal of Chemical Engineering, 21 (3), pp.733-738 (2004) Growth Mechanism of Needle-shaped ZnO Nanostructures over NiO-coated Si Substrates Kim TY, Lee SH, Mo YH, et al. |
| 7 |
Korean Journal of Chemical Engineering, 21 (1), pp.257-261 (2004) Growth of GaN Nanowires on Si Substrate Using Ni Catalyst in Vertical Chemical Vapor Deposition Reactor Kim TY, Lee SH, Mo YH, et al. |
| 8 |
Korean Journal of Chemical Engineering, 20 (6), pp.1134-1137 (2003) Improvement of Electrical and Optical Properties of InGaN/GaN-Based Light-Emitting Diodes with Triangular Quantum Well Structure Choi RJ, Hahn YB, Shim HW, et al. |
| 9 |
Korean Journal of Chemical Engineering, 13 (5), pp.522-529 (1996) GROWTH MECHANISM OF 3C-SiC(111) ON Si WITHOUT CARBONIZATION PROCESS Seo YH, Nahm KS, Suh EK, et al. |
